Invited Lectures

IX Mexican National Congress of Crystallography


Graciela Díaz de Delgado
Venezuela
abstract

Marcia Fantini
Brazil
abstract

Sven Lidin
Sweden
abstract

María Elena Villafuerte
Mexico
abstract

Bokhimi
Mexico
abstract

Gonzalo González
Mexico
abstract

Javier Martínez Juárez
Mexico
abstract

Jesús Palacios Gómez
Mexico
abstract

Arturo Ponce
USA
abstract

Adela Rodríguez
Mexico
abstract

José Chávez Carvayar
Mexico
abstract

María Eugenia Mendoza Alvarez
Mexico
abstract

Patricia Quintana Owen
Mexico
abstract

José Miguel Delgado
Venezuela
abstract

Lorena Pardo Mata
Spain
abstract

Amador González Crespo
Spain
abstract

XII Mexican National Congress of Microscopy


Kildare Miranda
Brazil
abstract

Wanderley de Souza
Brazil
abstract

Francisco Capani
Argentina
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Gema Gonzalez
Venezuela
abstract

Miguel Avalos
Mexico
abstract

Alberto Ruíz Marines
Mexico
abstract

VIII National Meeting for Synchrotron Users in Mexico


Michele Zema
Italy
abstract 1
abstract 2

José Jimenéz Mier y Terán
Mexico
abstract

Björn Winkler
Germany
abstract

Harald Reichert
France
abstract

Marius Ramírez Cardona
Mexico
abstract

Matías Moreno
Mexico
abstract

Vivian Stojanoff
USA
abstract

María Elena Montero Cabrera
México
abstract

Luis Fuentes Cobas
México
abstract

Mayra Cuéllar Cruz
México
abstract


RedTULS - Webpage:

VISIT

Technical Sessions


Patrick Shaw Stewart
Douglas Instruments Ltd, Hungerford, UK
abstract

Leopoldo Enríquez
JEOL, Mexico
abstract

ORGANIZATION

General Organizing Committee

José Reyes-Gasga
Jesús Á. Arenas Alatorre
Abel Moreno Cárcamo
Mayra Cuéllar Cruz
Lauro Bucio Galindo
Gustavo Tavizón Alvarado
Adolfo E. Cordero Borboa
Luis Felipe Jiménez García
Manuel Espinosa Pesqueira

Local Organizing Committee

Erick Juárez-Arellano
Ana Karin Navarro-Mtz
Miguel Angel Peña-Rico
Mario Valera Zaragoza
Isaac Machorro Cano
Mónica G. Segura Ozuna
Nelda X. Galero Martinez
Delia E. Páramo Calderón
Alejandro Aparicio Saguilan

Tutorial Courses

  • Scanning Electron Microscopy and EDS Techniques (in Spanish)

    Carlos Segovia & Enrique Enriquez, Micra brochure

    SAXS a Powerful Method for Nano-Materials Characterization

    Gerd Langenbucher, Sales Director SAXS-Anton Paar The Americas brochure

    CryoTEM and Tomography Images, Observation and Interpretation (in Spanish)

    Abrahan Hernández, JEOL & Luis Felipe Jiménez, FCUNAM brochure

    Solving Structures by TEM & STEM (in Spanish)

    Arturo Ponce Pedraza, University of Texas, San Antonio, USA brochure

    Using the PDF-4+ Database for Materials Analysis by Diffraction. Data mining (in Spanish)

    Miguel Delgado, los Andes Univ. Venezuela; Lauro Bucio, IFUNAM, Mexico brochure

    Synchrotron Radiation

    brochure